標題: Cycle time estimation for semiconductor final testing processes with Weibull-distributed waiting time
作者: Tai, Y. T.
Pearn, W. L.
Lee, J. H.
工業工程與管理學系
Department of Industrial Engineering and Management
關鍵字: cycle time estimation;semiconductor final testing;Weibull distribution
公開日期: 2012
摘要: Accurate cycle time is an essential planning basis required for many production applications, especially on due date commitments, performance metrics analysing, capacity planning, and scheduling. The re-entrant final testing process is the final stage of the complicated semiconductor manufacturing process. To enhance the ability of quick responses and to achieve better on-time delivery in final testing factories, it is essential to develop an accurate cycle time estimation method. In this paper, we provide a statistical approach to calculate the cycle time for multi-layer semiconductor final testing involving the sum of multiple Weibull-distributed waiting times. In addition, percentiles of the cycle time are obtained which are useful to industrial practitioners for due date commitments satisfying the targeted on-time delivery rate. To demonstrate the applicability of the proposed cycle time estimation model, a real example in a semiconductor final testing factory which is located on the Science-based Industrial Park in Hsinchu, Taiwan, is presented.
URI: http://hdl.handle.net/11536/16166
ISSN: 0020-7543
期刊: INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH
Volume: 50
Issue: 2
結束頁: 581
顯示於類別:期刊論文


文件中的檔案:

  1. 000303582300018.pdf