標題: Investigation on residual stress and stress-optical coefficient for flexible electronics by photoelasticity
作者: Lee, Y. C.
Liu, T. S.
Wu, C. I.
Lin, W. Y.
機械工程學系
Department of Mechanical Engineering
關鍵字: Stress-optical coefficient;Residual stress;Photoelasticity;Thin film;Flexible electronics
公開日期: 1-四月-2012
摘要: For flexible electronics in manufacture, the full-field stress measurement is an important issue for the film deposited on the flexible substrate. In this work, the two-dimensional photoelasticity is proposed to measure stress-optical coefficients and an analytical derivation is carried out for investigation on full-field residual stresses under tensional forces. In experimental setup, a polarization beam splitter (PBS) is used to connect with two CCD cameras that are used to capture the intensity of right-hand and left-hand circular polarization separately. It has higher measured speed and better uniformity than a direct rotation method. Stress-optical coefficients can be calculated by extracting the slope from tensional stress versus optical retardation curve. Experimental results show that optical retardations for indium-tin-oxide (ITO)-coated PET (polyethylene terephthalate) substrates can be affected more easily than PET substrates under tensional forces. The difference of stress-optical coefficients between 0 degrees and 90 degrees orientations for PEN (polyethylene naphthalate) substrates is smaller than that for PET substrates. Furthermore, it shows residual stresses for ITO-coated PET substrates in 0 degrees and 90 degrees orientations are different under tensional stress. (C) 2011 Elsevier Ltd. All rights reserved.
URI: http://hdl.handle.net/11536/16100
ISSN: 0263-2241
期刊: MEASUREMENT
Volume: 45
Issue: 3
結束頁: 311
顯示於類別:期刊論文


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  1. 000301221100012.pdf