標題: Capability indices for non-normal distributions with an application in electrolytic capacitor manufacturing
作者: Pearn, WL
Chen, KS
工業工程與管理學系
Department of Industrial Engineering and Management
公開日期: 1-十二月-1997
摘要: Process capability indices C-p(u, v), which include the four basic indices C-p, C-pk, C-pm and C-pmk as special cases, have been proposed to measure process potential and performance. C-p(u,v) are appropriate indices for processes with normal distributions, but have been shown to be inappropriate for processes with non-normal distributions. In this paper, we first consider two generalizations of C-p(u, v), which we refer to as C-Np(u, v) and C-Np(u, v), to cover cases where the underlying distributions may not be normal. Comparisons between C-Np(u, v) and C-Np'(u, v) are provided. The results indicated that the generalizations C-Np(u, v) are superior to C-Np'(u, v) in measuring process capability. We then present a case study on an aluminum electrolytic-capacitor manufacturing process to illustrate how the generalizations C-Np(u, v) may be applied to actual data collected from the factories. (C) 1997 Elsevier Science Ltd.
URI: http://hdl.handle.net/11536/161
ISSN: 0026-2714
期刊: MICROELECTRONICS AND RELIABILITY
Volume: 37
Issue: 12
起始頁: 1853
結束頁: 1858
顯示於類別:期刊論文


文件中的檔案:

  1. A1997YJ55000009.pdf