標題: A systematic estimation model for fraction nonconforming of a wafer in semiconductor manufacturing research
作者: Lin, Jun-Shuw
工業工程與管理學系
Department of Industrial Engineering and Management
關鍵字: Semiconductor manufacturing;Estimation for fraction nonconforming;Back-propagation neural network;Genetic algorithm;Self-organized map
公開日期: 1-六月-2012
摘要: The clustering phenomenon of defects usually occurs in semiconductor manufacturing. However, previous studies did not pay much attention to the influence of clustering phenomenon for estimating fraction nonconforming of a wafer. Thus, this paper presents a systematic estimation model with considering relevant variables about clustering defects for fraction nonconforming of a wafer. The method combines back-propagation neural network (BPNN) with genetic algorithm (GA) to obtain an estimation model. In this study, GA aims to optimize the parameters of BPNN. Five relevant variables: number of defects (ND), squared coefficient of angle variation (SCVA) for defects, squared coefficient of distance variation (SCVD) for defects, defect cluster index (CIM), and the number of cluster groups (NCG) for defects by self-organized map (SOM) are utilized as inputs for GA-BPNN. Finally, a simulation case and a real-world case are used to confirm the effectiveness of proposed method. (C) 2012 Elsevier B. V. All rights reserved.
URI: http://hdl.handle.net/11536/15967
ISSN: 1568-4946
期刊: APPLIED SOFT COMPUTING
Volume: 12
Issue: 6
結束頁: 1733
顯示於類別:期刊論文


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  1. 000302787900011.pdf