標題: On-chip detection circuit for protection design in display panel against electrical fast transient (EFT) disturbance
作者: Yen, Cheng-Cheng
Ker, Ming-Dou
Lin, Wan-Yen
Yang, Che-Ming
Chen, Shih-Fan
Chen, Tung-Yang
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 2011
摘要: A new on-chip detection circuit is proposed for electrical fast transient (EFT) protection design in a display system. For microelectronic products, electrical transient disturbances often cause upset or frozen states under the IEC test standard. The output signal of the proposed detection circuit can be used as a firmware index to execute system automatic recovery operations and to release the EFT-induced locked states in display panels. The circuit function to detect positive or negative electrical transients has been investigated in HSPICE simulation and verified in silicon chip. The experimental results have confirmed successful circuit performance under EFT tests. With hardware/firmware co-design, the immunity of a display system against electrical transient disturbance has been significantly improved.
URI: http://hdl.handle.net/11536/15913
http://dx.doi.org/012053
ISSN: 1742-6588
DOI: 012053
期刊: PROCEEDINGS OF THE 13TH INTERNATIONAL CONFERENCE ON ELECTROSTATICS: ELECTROSTATICS 2011
Volume: 301
顯示於類別:會議論文


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  1. 000303702800053.pdf