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dc.contributor.authorWu, Tse-Weien_US
dc.contributor.authorLee, Dong-Zhenen_US
dc.contributor.authorWu, Kai-Chiangen_US
dc.contributor.authorHuang, Yu-Haoen_US
dc.contributor.authorChen, Ying-Yenen_US
dc.contributor.authorChen, Po-Linen_US
dc.contributor.authorChern, Masonen_US
dc.contributor.authorLee, Jih-Nungen_US
dc.contributor.authorKao, Shu-Yien_US
dc.contributor.authorChao, Mango C. -T.en_US
dc.description.abstractConventional fault models define their faulty behavior at the IO ports of standard cells with simple rules of fault activation and fault propagation. However, there still exist some defects inside a cell (intra-cell) or between two cells (dual-cell) that cannot be effectively detected by the test patterns of conventional fault models and hence become a source of DPPM. In order to further increase the defect coverage, many research works have been conducted to study the fault models resulting from different types of intra-cell and dual-cell defects, by SPICE-simulating each targeted defect with its equivalent circuit-level defect model. However, it was considered computationally infeasible to simulate every possible defective scenario for a cell library and obtain a complete set of cell-level fault models. In this paper, we present a new dual-cell-aware (DCA) framework based on examining the layout of two adjacent cells (i.e., a dual cell) to identify potential defects, where time-consuming RC extraction can be avoided and the runtime for SPICE simulation can be reduced. Experimental results and silicon data on a SoC product show that the proposed DCA framework can not only save runtime significantly but also maintain the promising efficacy of DCA tests for the objective of lowering DPPM.en_US
dc.titleLayout-Based Dual-Cell-Aware Testsen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2019 IEEE 37TH VLSI TEST SYMPOSIUM (VTS)en_US
dc.contributor.departmentDepartment of Computer Scienceen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
Appears in Collections:Conferences Paper