標題: Production yield measure for multiple characteristics processes based on S-pk(T) under multiple samples
作者: Pearn, W. L.
Yen, Ching-Ho
Yang, Dong-Yuh
工業工程與管理學系
Department of Industrial Engineering and Management
關鍵字: Asymptotic distribution;Multiple characteristics;Process yield;Standard bootstrap
公開日期: 1-三月-2012
摘要: Process yield is an important criterion used in the manufacturing industry for measuring process performance. Methods for measuring yield for processes with single characteristic have been investigated extensively. However, methods for measuring yield for processes with multiple characteristics have been comparatively neglected. Chen et al. (Qual Reliab Eng Int 19:101-110, 2003) proposed a measurement formula called S-pk(T) which provides an exact measure of the overall process yield, for processes with multiple characteristics. In this paper, we considered the natural estimator of S-pk(T) under multiple samples, and derived the asymptotic distribution for the estimator. In addition, a comparison between the SB (standard bootstrap) and the proposed method based on the lower confidence bound is executed. Generally, the result indicates that the proposed approach is more reliable than the standard bootstrap method.
URI: http://dx.doi.org/10.1007/s10100-010-0152-9
http://hdl.handle.net/11536/15209
ISSN: 1435-246X
DOI: 10.1007/s10100-010-0152-9
期刊: CENTRAL EUROPEAN JOURNAL OF OPERATIONS RESEARCH
Volume: 20
Issue: 1
起始頁: 65
結束頁: 85
顯示於類別:期刊論文


文件中的檔案:

  1. 000299920600004.pdf