標題: Direct spectroscopic evidence of charge reversal at the Pb(Zr0.2Ti0.8)O-3/La0.7Sr0.3MnO3 heterointerface
作者: Wu, Chung-Lin
Lee, Pei-Wei
Chen, Yi-Chun
Chang, Lo-Yueh
Chen, Chia-Hao
Liang, Chen-Wei
Yu, Pu
He, Qing
Ramesh, R.
Chu, Ying-Hao
材料科學與工程學系
Department of Materials Science and Engineering
公開日期: 21-Jan-2011
摘要: At the heterointerface of a top ferroelectric Pb(Zr0.2Ti0.8)O-3 (PZT) ultrathin film and a bottom La0.7Sr0.3MnO3 (LSMO) electrode, we used continuous synchrotron-radiation photoelectron spectroscopy to probe in situ and demonstrated that the interfacial charges are reversible and their affected valence-band barrier height becomes modulated upon switching the polarization in the top layer. By monitoring the core-level shifting of the buried LSMO layer under continuous illumination of synchrotron radiation, we directly observed a temporal screening of polarization induced by the photon-generated carriers in the top PZT layer. This dynamic characterization of the core-level shifting of the buried layer demonstrates an effective method to probe the electric conduction and ferroelectric polarization of an ultrathin ferroelectric oxide thin film.
URI: http://dx.doi.org/10.1103/PhysRevB.83.020103
http://hdl.handle.net/11536/150234
ISSN: 1098-0121
DOI: 10.1103/PhysRevB.83.020103
期刊: PHYSICAL REVIEW B
Volume: 83
Issue: 2
起始頁: 0
結束頁: 0
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