Title: A 12-Bit 1.25-GS/s DAC in 90 nm CMOS With > 70 dB SFDR up to 500 MHz
Authors: Tseng, Wei-Hsin
Fan, Chi-Wei
Wu, Jieh-Tsorng
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
Keywords: Background calibration;current-steering;D/A converters;digital random return-to-zero (DRRZ);digital-analog conversion;digital-to-analog converter (DAC);return-to-zero (RZ)
Issue Date: 1-Dec-2011
Abstract: A current-steering digital-to-analog converter (DAC) was fabricated using a 90 nm CMOS technology. Its dynamic performance is enhanced by adopting a digital random return-to-zero (DRRZ) operation and a compact current cell design. The DRRZ also facilitates a current-cell background calibration technique that ensures the DAC static linearity. The measured differential nonlinearity (DNL) is 0.5 LSB and the integral nonlinearity (INL) is 1.2 LSB. At 1.25 GS/s sampling rate, the DAC achieves a spurious-free dynamic range (SFDR) better than 70 dB up to 500 MHz input frequency. The DAC occupies an active area of 1100 x 750 mu m(2). It consumes a total of 128 mW from a 1.2 V and a 2.5 V supply.
URI: http://dx.doi.org/10.1109/JSSC.2011.2164302
http://hdl.handle.net/11536/14920
ISSN: 0018-9200
DOI: 10.1109/JSSC.2011.2164302
Journal: IEEE JOURNAL OF SOLID-STATE CIRCUITS
Volume: 46
Issue: 12
Begin Page: 2845
End Page: 2856
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