標題: New 4-Bit Transient-to-Digital Converter for System-Level ESD Protection in Display Panels
作者: Ker, Ming-Dou
Yen, Cheng-Cheng
電機學院
College of Electrical and Computer Engineering
關鍵字: Converter;electromagnetic compatibility;electrostatic discharge (ESD);system-level ESD test;transient detection circuit
公開日期: 1-二月-2012
摘要: A new on-chip 4-bit transient-to-digital converter for system-level electrostatic discharge (ESD) protection design is proposed. The proposed converter is designed to detect ESD-induced transient disturbances and transfer different ESD voltages into digital codes under system-level ESD tests. The experimental results in a 0.13-mu m CMOS integrated circuit with 1.8-V devices have confirmed the detection function and digital output codes. The proposed on-chip transient-to-digital converter can be code-signed with firmware operations to effectively enhance immunity of display systems against system-level ESD stresses.
URI: http://dx.doi.org/10.1109/TIE.2011.2157292
http://hdl.handle.net/11536/14877
ISSN: 0278-0046
DOI: 10.1109/TIE.2011.2157292
期刊: IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
Volume: 59
Issue: 2
起始頁: 1278
結束頁: 1287
顯示於類別:期刊論文


文件中的檔案:

  1. 000296014800062.pdf