標題: Development of Limited-Angle Iterative Reconstruction Algorithms with Context Encoder-Based Sinogram Completion for Micro-CT Applications
作者: Jin, Shih-Chun
Hsieh, Chia-Jui
Chen, Jyh-Cheng
Tu, Shih-Huan
Chen, Ya-Chen
Hsiao, Tzu-Chien
Liu, Angela
Chou, Wen-Hsiang
Chu, Woei-Chyn
Kuo, Chih-Wei
分子醫學與生物工程研究所
資訊工程學系
資訊科學與工程研究所
Institute of Molecular Medicine and Bioengineering
Department of Computer Science
Institute of Computer Science and Engineering
關鍵字: context encoder (CE);limited-angle iterative reconstruction (LAIR);generative adversarial network (GAN)
公開日期: 1-Dec-2018
摘要: Limited-angle iterative reconstruction (LAIR) reduces the radiation dose required for computed tomography (CT) imaging by decreasing the range of the projection angle. We developed an image-quality-based stopping-criteria method with a flexible and innovative instrument design that, when combined with LAIR, provides the image quality of a conventional CT system. This study describes the construction of different scan acquisition protocols for micro-CT system applications. Fully-sampled Feldkamp (FDK)-reconstructed images were used as references for comparison to assess the image quality produced by these tested protocols. The insufficient portions of a sinogram were inpainted by applying a context encoder (CE), a type of generative adversarial network, to the LAIR process. The context image was passed through an encoder to identify features that were connected to the decoder using a channel-wise fully-connected layer. Our results evidence the excellent performance of this novel approach. Even when we reduce the radiation dose by 1/4, the iterative-based LAIR improved the full-width half-maximum, contrast-to-noise and signal-to-noise ratios by 20% to 40% compared to a fully-sampled FDK-based reconstruction. Our data support that this CE-based sinogram completion method enhances the efficacy and efficiency of LAIR and that would allow feasibility of limited angle reconstruction.
URI: http://dx.doi.org/10.3390/s18124458
http://hdl.handle.net/11536/148670
ISSN: 1424-8220
DOI: 10.3390/s18124458
期刊: SENSORS
Volume: 18
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