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第 1 到 10 筆結果,共 144 筆。

符合的文件:
公開日期標題作者
2013Type-II Ge/Si Quantum Dot superlattice for Intermediate-band Solar Cell ApplicationsHu, Weiguo; Fauzi, Mohd Erman; Igarashi, Makoto; Higo, Akio; Lee, Ming-Yi; Li, Yiming; Usami, Noritaka; Samukawa, Seiji; 電機工程學系; Department of Electrical and Computer Engineering
2006Evaluation of account receivable collection alternatives with fuzzy MCDM methodologyHung, Chih-Young; Li, Yiming; Chiang, Yi-Hui; 科技管理研究所; Institute of Management of Technology
2009A Unified Parameterization Technique for TFT-LCD Panel Design OptimizationHuang, Hsuan-Ming; Li, Yiming; 電信工程研究所; Institute of Communications Engineering
2008A Dynamic Competition Analysis on the Personal Computer Shipments in Taiwan Using Lotka-Volterra ModelChiang, Su-Yun; Wong, Gwo-Gauang; Li, Yiming; Yu, Hsiao-Cheng; 科技管理研究所; Institute of Management of Technology
2008A Symbiosis Model for New Product Development through Open Innovation ProcessYang, Chia-Han; Shyu, Joseph Z.; Li, Yiming; 科技管理研究所; Institute of Management of Technology
2015Process Variation Effect, Metal-Gate Work-Function Fluctuation and Random Dopant Fluctuation of 10-nm Gate-All-Around Silicon Nanowire MOSFET DevicesLi, Yiming; Chang, Han-Tung; Lai, Chun-Ning; Chao, Pei-Jung; Chen, Chieh-Yang; 交大名義發表; 傳播研究所; 分子醫學與生物工程研究所; 電機學院; National Chiao Tung University; Institute of Communication Studies; Institute of Molecular Medicine and Bioengineering; College of Electrical and Computer Engineering
2012Random Work Function Induced DC Characteristic Fluctuation in 16-nm High-kappa/Metal Gate Bulk and SOI FinFETsSu, Hsin-Wen; Chen, Yu-Yu; Chen, Chieh-Yang; Cheng, Hui-Wen; Chang, Han-Tung; Li, Yiming; 電機工程學系; Department of Electrical and Computer Engineering
2012On Statistical Variation of MOSFETs Induced by Random-Discrete-Dopants and Random-Interface-TrapsLi, Yiming; Su, Hsin-Wen; Chen, Chieh-Yang; Cheng, Hui-Wen; Chen, Yu-Yu; Chang, Han-Tung; 資訊工程學系; Department of Computer Science
2011Modeling Bias Stress Effect on Threshold Voltage for Amorphous Silicon Thin-Film Transistors and CircuitsShen, Cheng-Han; Lo, I-Hsiu; Li, Yiming; 電機學院; 電子工程學系及電子研究所; College of Electrical and Computer Engineering; Department of Electronics Engineering and Institute of Electronics
2011Effects of Random Work Function Fluctuations in Nanoszied Metal Grains on Electrical Characteristic of 16 nm High-kappa/Metal Gate Bulk FinFETsCheng, Hui-Wen; Chiu, Yung-Yueh; Li, Yiming; 電機學院; 電子工程學系及電子研究所; College of Electrical and Computer Engineering; Department of Electronics Engineering and Institute of Electronics