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Issue DateTitleAuthor(s)
1-Nov-2008Investigation and Design of On-Chip Power-Rail ESD Clamp Circuits Without Suffering Latchup-Like Failure During System-Level ESD TestKer, Ming-Dou; Yen, Cheng-Cheng; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2012New Design of Transient-Noise Detection Circuit with SCR Device for System-Level ESD ProtectionKer, Ming-Dou; Lin, Wan-Yen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2010ESD Protection Circuit for High-Voltage CMOS ICs with Improved Immunity Against Transient-Induced LatchupKer, Ming-Dou; Hsu, Che-Lun; Chen, Wen-Yi; 電機學院; College of Electrical and Computer Engineering
2008ESD protection design for fully integrated CMOS RF power amplifiers with waffle-structured SCRKer, Ming-Dou; Lin, Chun-Yu; Meng, Guo-Xuan; 電機學院; College of Electrical and Computer Engineering
1-Nov-2006Self-substrate-triggered technique to enhance turn-on uniformity of multi-finger ESD protection devicesKer, Ming-Dou; Chen, Jia-Huei; 電機學院; College of Electrical and Computer Engineering
1-May-2009Design of Mixed-Voltage-Tolerant Crystal Oscillator Circuit in Low-Voltage CMOS TechnologyWang, Tzu-Ming; Ker, Ming-Dou; Liao, Hung-Tai; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2009Design and Realization of Delta-Sigma Analog-to-Digital Converter in LTPS TechnologyTsai, Chia-Chi; Ker, Ming-Dou; Li, Yu-Hsuan; Kuo, Chung-Hung; Li, Chun-Huai; Hsieh, Yao-Jen; Liu, Chun-Ting; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-May-2008Low-capacitance SCR with waffle layout structure for on-chip ESD protection in RF ICsKer, Ming-Dou; Lin, Chun-Yu; 電機學院; College of Electrical and Computer Engineering
2012ESD Protection Structure with Inductor-Triggered SCR for RF Applications in 65-nm CMOS ProcessLin, Chun-Yu; Chu, Li-Wei; Ker, Ming-Dou; Song, Ming-Hsiang; Jou, Chewn-Pu; Lu, Tse-Hua; Tseng, Jen-Chou; Tsai, Ming-Hsien; Hsu, Tsun-Lai; Hung, Ping-Fang; Chang, Tzu-Heng; 交大名義發表; National Chiao Tung University
1-Jan-2013Ultra-Low-Leakage Power-Rail ESD Clamp Circuit in a 65-nm CMOS TechnologyAltolaguirre, Federico A.; Ker, Ming-Dou; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics