Title: Perpendicular interface resistance in Co/NbxTi1-x multilayers for normal and superconducting NbTi alloy with x=0.4, 0.6
Authors: Huang, SY
Lee, SF
Huang, JC
Hwang, GH
Yao, YD
Department of Electrophysics
Issue Date: 15-May-2005
Abstract: We report here the resistance of Co/NbxTi1-x multilayers, for x=0.4 and 0.6, with current flowing perpendicular to the layer plane at 4.2 K. When NbTi films are sandwiched between Co, we found that there are critical thicknesses of 20 nm for x=0.4 and 27 nm for x=0.6, below which no superconducting transition could be found. Using a series resistor model, we extracted the unit area resistance of one pair of Co/NbTi interfaces and compared with the pure Nb case we have reported. The influence of mean free paths and superconducting coherence lengths is analyzed. (c) 2005 American Institute of Physics.
URI: http://dx.doi.org/10.1063/1.1850373
ISSN: 0021-8979
DOI: 10.1063/1.1850373
Volume: 97
Issue: 10
End Page: 
Appears in Collections:Conferences Paper

Files in This Item:

  1. 000230168300085.pdf