標題: Introduction to the special issue on the 2004 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
作者: Pey, KL
Trigg, A
Chung, S
交大名義發表
National Chiao Tung University
公開日期: 1-六月-2005
URI: http://dx.doi.org/10.1109/TDMR.2005.849903
http://hdl.handle.net/11536/13677
ISSN: 1530-4388
DOI: 10.1109/TDMR.2005.849903
期刊: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Volume: 5
Issue: 2
起始頁: 167
結束頁: 167
顯示於類別:期刊論文


文件中的檔案:

  1. 000230223000001.pdf