標題: A competitive algorithm to find all defective edges in a graph
作者: Hwang, FK
應用數學系
Department of Applied Mathematics
關鍵字: group testing;graph testing;competitive algorithm
公開日期: 15-六月-2005
摘要: Consider a graph G (V, E) where a subset D E E is called the set of defective edges. The problem is to identify D with a small number of edge tests, where an edge test takes an arbitrary subset S and asks whether the subgraph G(S) induced by S intersects D (contains a defective edge). Recently, Johann gave an algorithm to find all d defective edges in a graph assuming d D I is known. We give an algorithm with d unknown which requires at most d([log(2) vertical bar E vertical bar] + 4) + 1 tests. The information-theoretic bound, knowing d, is about d log(2) (vertical bar E vertical bar/d). For d fixed, our algorithm is competitive with coefficient 1. (c) 2005 Elsevier B.V. All rights reserved.
URI: http://dx.doi.org/10.1016/j.dam.2005.02.010
http://hdl.handle.net/11536/13581
ISSN: 0166-218X
DOI: 10.1016/j.dam.2005.02.010
期刊: DISCRETE APPLIED MATHEMATICS
Volume: 148
Issue: 3
起始頁: 273
結束頁: 277
顯示於類別:期刊論文


文件中的檔案:

  1. 000230062600007.pdf