標題: Dark field image of full-field transmission hard x-ray microscope in 8-11 keV
作者: Yin, Gung-Chian
Duewer, Fred
Zeng, Xianghui
Lyon, Alan
Yun, Wenbing
Chen, Fu-Rong
Liang, K. S.
光電工程學系
Department of Photonics
關鍵字: transmission x-ray microscope;dark field;contrast
公開日期: 1-Jan-2006
摘要: We have demonstrated dark-field imaging using a full-field hard x-ray microscope by using a custom capillary-based condenser. The condenser provides illumination with a numeric aperture about 3-mrad with high efficiency. This high illumination angle allows full-resolution imaging using a 50 rim hard x-ray zone plate. The zeroth order beam from the condenser is well out of the zoneplate range - which allows a high signal-to-noise ratio in the image plane. Small particles with high scattering power, such as colloidal gold markers used in biology are well-suited for dark-field imaging. Combining with high brightness source from NSRRC BL01B, the dark field image can be acquired within several minutes with high contrast ratio. In this paper, the dark field image of IC and the zoneplate defect will be demonstrated and studied in different energy under dark field mode.
URI: http://dx.doi.org/10.1117/12.680216
http://hdl.handle.net/11536/135676
ISBN: 0-8194-6396-5
ISSN: 0277-786X
DOI: 10.1117/12.680216
期刊: ADVANCES IN X-RAY/EUV OPTICS, COMPONENTS, AND APPLICATIONS
Volume: 6317
起始頁: 0
結束頁: 0
Appears in Collections:Conferences Paper


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