標題: Code-pattern insensitive embedded ROMs using dynamic bitline shielding technique
作者: Chang, MF
Chiou, LY
Wen, KA
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 21-七月-2005
摘要: A dynamic bitline shielding (DBS) technique is proposed for highspeed via-programming ROMs, to eliminate code-pattem-dependent crosstalk-induced read failure (CIRF) and increase code-pattem coverage. Fabricated 256 Kb conventional and DBS ROMs demonstrated that the DBS technique can eliminate the CIRF and operate with a small sensing margin.
URI: http://dx.doi.org/10.1049/el:20051738
http://hdl.handle.net/11536/13476
ISSN: 0013-5194
DOI: 10.1049/el:20051738
期刊: ELECTRONICS LETTERS
Volume: 41
Issue: 15
起始頁: 834
結束頁: 835
顯示於類別:期刊論文


文件中的檔案:

  1. 000233419800003.pdf