Title: Code-pattern insensitive embedded ROMs using dynamic bitline shielding technique
Authors: Chang, MF
Chiou, LY
Wen, KA
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
Issue Date: 21-Jul-2005
Abstract: A dynamic bitline shielding (DBS) technique is proposed for highspeed via-programming ROMs, to eliminate code-pattem-dependent crosstalk-induced read failure (CIRF) and increase code-pattem coverage. Fabricated 256 Kb conventional and DBS ROMs demonstrated that the DBS technique can eliminate the CIRF and operate with a small sensing margin.
URI: http://dx.doi.org/10.1049/el:20051738
http://hdl.handle.net/11536/13476
ISSN: 0013-5194
DOI: 10.1049/el:20051738
Journal: ELECTRONICS LETTERS
Volume: 41
Issue: 15
Begin Page: 834
End Page: 835
Appears in Collections:Articles


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