標題: Degradation of InGaN/GaN LEDs under Forward-bias Operations in Salty Water Vapor
作者: Chen, Hsiang
Hsieh, Kun Min
He, Yun Yang
Chu, Li Chen
Lee, Ming Ling
Chang, Kow Ming
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: Green InGaN/GaN LED;Salty Water Vapor;Forward-bias;Corrosion;Au diffussion
公開日期: 2016
摘要: Forward-bias stress in salty water vapor can quickly degrade the InGaN/GaN LEDs. To examine the weakness of the device, electrical, optical, and material analyses and characterizations were performed to investigate the failure mechanism. Corrosion of the electrode and Au atom diffusion might result in damages of the device. Results indicate that forward-bias stress in salty water vapor can quickly influence the material properties, optical behaviors, and electrical characteristics of the LED device.
URI: http://hdl.handle.net/11536/133976
ISSN: 1480-2422
期刊: JOURNAL OF NEW MATERIALS FOR ELECTROCHEMICAL SYSTEMS
Volume: 19
Issue: 1
起始頁: 7
結束頁: 10
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