Title: Control Charts for the Lognormal Mean
Authors: Huang, Wei-Heng
Wang, Hsiuying
Yeh, Arthur B.
Institute of Statistics
Keywords: average run length;lognormal distribution;X-chart
Issue Date: Jun-2016
Abstract: Among a set of tools that form the core of statistical process control, statistical control charts are most commonly used for controlling, monitoring, and improving processes. The conventional control charts are based on the assumption that the distribution of the quality characteristic to be monitored follows the normal distribution. However, in real applications, many process distributions may follow a positively skewed distribution such as the lognormal distribution. In this study, we discuss the construction of several control charts for monitoring the mean of the lognormal distribution. A real example is used to demonstrate how these charts can be applied in practice. Copyright (c) 2015 John Wiley & Sons, Ltd.
URI: http://dx.doi.org/10.1002/qre.1841
ISSN: 0748-8017
DOI: 10.1002/qre.1841
Volume: 32
Issue: 4
Begin Page: 1407
End Page: 1416
Appears in Collections:Articles