|Title:||Control Charts for the Lognormal Mean|
Yeh, Arthur B.
Institute of Statistics
|Keywords:||average run length;lognormal distribution;X-chart|
|Abstract:||Among a set of tools that form the core of statistical process control, statistical control charts are most commonly used for controlling, monitoring, and improving processes. The conventional control charts are based on the assumption that the distribution of the quality characteristic to be monitored follows the normal distribution. However, in real applications, many process distributions may follow a positively skewed distribution such as the lognormal distribution. In this study, we discuss the construction of several control charts for monitoring the mean of the lognormal distribution. A real example is used to demonstrate how these charts can be applied in practice. Copyright (c) 2015 John Wiley & Sons, Ltd.|
|Journal:||QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL|
|Appears in Collections:||Articles|