標題: Dissociation dynamics of excited neutral fragments of gaseous SiCl4 following Si 2p and Cl 2p core-level excitations
作者: Chen, JM
Lu, KT
Lee, JM
Ho, SC
Chang, HW
電子物理學系
Department of Electrophysics
公開日期: 1-九月-2005
摘要: State-specific dissociation dynamics for excited fragments of gaseous SiCl4 following Cl 2p and Si 2p core-level excitations were characterized by the dispersed UV/optical fluorescence spectroscopy. The core-to-Rydberg excitations at both Si 2p and Cl 2p edges lead to a noteworthy production of excited atomic fragments, neutral and ionic (Si-*,Si+*). In particular, the excited neutral atomic fragments Si-* are significantly reinforced. The core-to-valence excitation at the Si 2p edge generates an enhancement of excited molecular-ion SiCl4+. The experimental results provide deeper insight into the dissociation dynamics for excited neutral fragments of molecules via core-level excitation.
URI: http://dx.doi.org/10.1103/PhysRevA.72.032706
http://hdl.handle.net/11536/13366
ISSN: 1050-2947
DOI: 10.1103/PhysRevA.72.032706
期刊: PHYSICAL REVIEW A
Volume: 72
Issue: 3
結束頁: 
顯示於類別:期刊論文