Title: A service level model for the control wafers safety inventory problem
Authors: Chung, SH
Kang, HY
Pearn, WL
工業工程與管理學系
Department of Industrial Engineering and Management
Keywords: control wafers;nonlinear programming model;pull control;safety inventory;service level
Issue Date: 1-Sep-2005
Abstract: This paper considers the control wafers safety inventory problem (CWSIP) in the wafer fabrication photolithography area. The objective is to minimize the total cost of control wafers, where the cost includes new wafers cost, re-entrant cost and holding cost while maintaining the same level of production throughput. For the problem under pulling control production environment, a nonlinear programming model is presented to set safety inventory levels so as to minimize total cost of control wafers. A numerical example is given to illustrate the practicality of the model. The results demonstrate that the proposed model is an effective tool for determining the service level of safety inventory of control wafers for each grade.
URI: http://dx.doi.org/10.1007/s00170-003-2028-9
http://hdl.handle.net/11536/13327
ISSN: 0268-3768
DOI: 10.1007/s00170-003-2028-9
Journal: INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
Volume: 26
Issue: 5-6
Begin Page: 591
End Page: 597
Appears in Collections:Articles


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