標題: Test of the Practicality and Feasibility of EDoF-Empowered Image Sensors for Long-Range Biometrics
作者: Hsieh, Sheng-Hsun
Li, Yung-Hui
Tien, Chung-Hao
光電工程學系
Department of Photonics
關鍵字: wavefront coding;extended depth of field;iris recognition;biometrics
公開日期: 1-Dec-2016
摘要: For many practical applications of image sensors, how to extend the depth-of-field (DoF) is an important research topic; if successfully implemented, it could be beneficial in various applications, from photography to biometrics. In this work, we want to examine the feasibility and practicability of a well-known "extended DoF" (EDoF) technique, or "wavefront coding," by building real-time long-range iris recognition and performing large-scale iris recognition. The key to the success of long-range iris recognition includes long DoF and image quality invariance toward various object distance, which is strict and harsh enough to test the practicality and feasibility of EDoF-empowered image sensors. Besides image sensor modification, we also explored the possibility of varying enrollment/testing pairs. With 512 iris images from 32 Asian people as the database, 400-mm focal length and F/6.3 optics over 3 m working distance, our results prove that a sophisticated coding design scheme plus homogeneous enrollment/testing setups can effectively overcome the blurring caused by phase modulation and omit Wiener-based restoration. In our experiments, which are based on 3328 iris images in total, the EDoF factor can achieve a result 3.71 times better than the original system without a loss of recognition accuracy.
URI: http://dx.doi.org/10.3390/s16121994
http://hdl.handle.net/11536/133090
ISSN: 1424-8220
DOI: 10.3390/s16121994
期刊: SENSORS
Volume: 16
Issue: 12
起始頁: 0
結束頁: 0
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