|標題:||A note on production yield measure for multiple lines|
|作者:||Pearn, W. L.|
Tai, Y. T.
Wu, C. H.
Department of Industrial Engineering and Management
|關鍵字:||Capability index;critical value;lower confidence bound;multiple manufacturing lines;production yield|
|摘要:||In today\'s globally competitive environment, processes involving multiple manufacturing lines are quite common due to economies of scale considerations. Production yield measure indices C-pk and C-pu are the most popular yield-based indices and have been widely used in manufacturing industries for two-sided and one-sided specification limits, respectively. In this paper, two production yield indices for multiple lines C-pk(M) and C-pu(M) are considered and the approximate distributions of two natural estimators C-pk(M) and C-pu(M) are derived. For the convenience of industry applications, the lower confidence bounds and critical values are provided.|
|期刊:||QUALITY TECHNOLOGY AND QUANTITATIVE MANAGEMENT|
|Appears in Collections:||Articles|