標題: Surface chemical and leakage current density characteristics of nanocrystalline Ag-Ba0.5Sr0.5TiO3 thin films
作者: Jayadevan, KP
Liu, CY
Tseng, TY
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 1-九月-2005
摘要: Nanocrystatfine chi Ag-(1-x)Ba0.5Sr0.5TiO3(Ag-BST, 0 <= x <= 0.1, where x is the mole fraction of Ag) thin films have been deposited on Pt/Ti/SiO2/Si substrates by a sol-gel method. The films have been characterized by X-ray diffraction (XRD), scanning electron microscopy, and X-ray photoelectron spectroscopy (XPS). The core-level XPS of oxygen (O1s) of the Ag-BST films indicate that an optimum amount of Ag (x = 0.02 or 2 mol%) enhances the binding energy of oxygen, possibly through a mechanism in which the electrophilic oxygen dissociates from the Ag surface and fills the oxygen vacancies. Similarly, the binding energy of Ag (Ag3d) shows a shift toward a higher value with increasing Ag up to 4 mol%, probably because of the chemical shift of Ag in BST along the surface layers, surface relaxation, or changes in the Fermi level of small Ag particles in the solid solution range of Ag in BST fillms (x <= 0.04). The leakage current density of 2 mol% Ag-added BST (similar to 10(-6) A/cm(2)) is less by about an order of magnitude than pure BST at an electric field of 200 kV/cm. A defect model is proposed to explain the observed leakage current density of Ag-BST films satisfactorily.
URI: http://dx.doi.org/10.1111/j.1551-2916.2005.00441.x
http://hdl.handle.net/11536/13282
ISSN: 0002-7820
DOI: 10.1111/j.1551-2916.2005.00441.x
期刊: JOURNAL OF THE AMERICAN CERAMIC SOCIETY
Volume: 88
Issue: 9
起始頁: 2456
結束頁: 2460
顯示於類別:期刊論文


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  1. 000231634800021.pdf