標題: A full code-patterns coverage high-speed embedded ROM using dynamic virtual guardian technique
作者: Chang, MF
Chiou, LY
Wen, KA
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: code-patterns;crosstalk;ROM
公開日期: 1-二月-2006
摘要: Crosstalk between bitlines induces read failure and limits the coverage of applicable code-patterns for high-speed contact/via-programming read-only memories (ROMs) in SoC. Owing to the variation in bitline loading across code-patterns, the amount of coupled noise on an accessed bitline is code-pattern-dependent. This crosstalk effect worsens, with larger coupling capacitance and smaller intrinsic loading, as the technology node shrinks. This study proposes dynamic virtual guardian (DVG) techniques for contact/via-programming ROM macros and compilers to eliminate the crosstalk-induced read failure and increase the code-patterns coverage. Compared with conventional ROMs, DVG techniques achieve higher speed, lower power consumption and better design for manufacturing (DFM) capability with full code-patterns coverage. Experiments on fabricated designs, a conventional ROM and two 256 Kb DVG ROMs, using 0.18 mu m 1P5M CMOS technology have demonstrated that DVG techniques achieve 100% code-pattern coverage under a small sensing margin.
URI: http://dx.doi.org/10.1109/JSSC.2005.862343
http://hdl.handle.net/11536/12699
ISSN: 0018-9200
DOI: 10.1109/JSSC.2005.862343
期刊: IEEE JOURNAL OF SOLID-STATE CIRCUITS
Volume: 41
Issue: 2
起始頁: 496
結束頁: 506
顯示於類別:期刊論文


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  1. 000235372800019.pdf