標題: Optimization of broadband RF performance and ESD robustness by pi-model distributed ESD protection scheme
作者: Ker, MD
Kuo, BJ
Hsiao, YW
電機學院
College of Electrical and Computer Engineering
關鍵字: broadband;distributed;ESD;protection;scheme
公開日期: 1-Feb-2006
摘要: Large electrostatic discharge (ESD) protection devices close to the I/O pins, beneficial for ESD protection, have an adverse effect on the performance of broadband radio-frequency (RF) circuits for impedance mismatch and bandwidth degradation. A new proposed ESD protection structure, pi-model distributed ESD (pi-DESD) protection circuit, composed of one pair of ESD devices near the I/O pin, the other pair close to the core circuit, and a coplanar waveguide with under-grounded shield (CPWG) connecting these two pairs, can successfully achieve both excellent ESD robustness and good broadband RF performance. Cooperating with the active power-rail ESD clamp circuit, the experimental chip in a 0.25-mu m CMOS process can sustain the human-body-model (HBM) ESD stress of 8 kV. (c) 2005 Elsevier B.V. All rights reserved.
URI: http://dx.doi.org/10.1016/j.elstat.2005.03.086
http://hdl.handle.net/11536/12647
ISSN: 0304-3886
DOI: 10.1016/j.elstat.2005.03.086
期刊: JOURNAL OF ELECTROSTATICS
Volume: 64
Issue: 2
起始頁: 80
結束頁: 87
Appears in Collections:Conferences Paper


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