Title: Advanced Soft-Error-Rate (SER) Estimation with Striking-Time and Multi-Cycle Effects
Authors: Huang, Ryan H-M
Wen, Charles H-P
Undergraduate Honors Program of Electrical Engineering and Computer Science
Keywords: Soft error;transient fault
Issue Date: 1-Jan-2014
Abstract: Soft error rate (SER) has become a critical reliability issue for CMOS designs due to continuous technology scaling. However, the striking-time and multi-cycle effects have not been properly considered in SER for advanced CMOS designs. Therefore, in this paper, the striking-time and multicycle effects are formulated into the problem of SER estimation, and then a SER analysis framework is proposed, accordingly. Experimental results show that SERs on the benchmark circuits are seriously underestimated when ignoring both effects. Moreover, SERs increase more on those high-performance or low-power CMOS designs. New treatment to SER needs to be explored in the future.
URI: http://hdl.handle.net/11536/124920
ISBN: 978-1-4503-2730-5
ISSN: 0738-100X
Appears in Collections:Conferences Paper