標題: Exploiting the image of the surface reflectivity to measure refractive index profiling for various optical fibers
作者: Weng, Chun-Jen
Hsu, Ken-Yuh
Chen, Yung-Fu
電子物理學系
光電工程學系
Department of Electrophysics
Department of Photonics
公開日期: 4-五月-2015
摘要: A direct image method of surface reflectivities on a cleaved fiber end with a filtered halogen lamp and a TE-cooled CCD with high dynamic range is proposed to measure the multi-wavelength refractive index profiling (RIP). A polished black glass is used to be a reference standard for measuring the absolute reflectivity of the fiber end. With the developed calibration procedures, both the spatially dependent sensitivity and spectral responsivity of the CCD pixels can be eliminated to achieve the high spatial accuracy. Tested fiber is connected with a fiber terminator to prevent errors from the backside return light. With the present method, the RIP can be precisely measured for not only multi-mode fibers but also single-mode fibers. (C) 2015 Optical Society of America
URI: http://dx.doi.org/10.1364/OE.23.011755
http://hdl.handle.net/11536/124823
ISSN: 1094-4087
DOI: 10.1364/OE.23.011755
期刊: OPTICS EXPRESS
Volume: 23
起始頁: 11755
結束頁: 11762
顯示於類別:期刊論文