Title: Electro-optical measurement and process inspection for integrated gate driver circuit on thin-film-transistor array panels
Authors: Wang, Yao-Chin
Lin, Bor-Shyh
Chan, Ming-Che
Institute of Photonic System
Institute of Imaging and Biomedical Photonics
Keywords: Electro-optical measurement;Integrated gate driver;TFT array panel
Issue Date: 1-Jun-2015
Abstract: The study proposed electro-optical measurement and process inspection for integrated-gate-driver circuit on thin-film-transistor array panel. It is a trend on the developing with application of integrated gate driver circuit in the narrow frame design and reduction of driver integrated circuit chips in thin-film-transistor array backplane. Over the past, it cannot detect that contain integrated-gate-driver circuit on thin-film-transistor array panel, especially in process defects of the integrated-gate-driver circuit. The paper proposed a process inspection for the defects in integrated-gate-driver circuit on the thin-film-transistor array panel by the voltage imaging technique and reported good performance. (C) 2015 Elsevier Ltd. All rights reserved.
URI: http://dx.doi.org/10.1016/j.measurement.2015.03.018
ISSN: 0263-2241
DOI: 10.1016/j.measurement.2015.03.018
Volume: 70
Begin Page: 83
End Page: 87
Appears in Collections:Articles