標題: A Fully Integrated Nose-on-a-Chip for Rapid Diagnosis of Ventilator-Associated Pneumonia
作者: Chiu, Shih-Wen
Wang, Jen-Huo
Chang, Kwuang-Han
Chang, Ting-Hau
Wang, Chia-Min
Chang, Chia-Lin
Tang, Chen-Ting
Chen, Chien-Fu
Shih, Chung-Hung
Kuo, Han-Wen
Wang, Li-Chun
Chen, Hsin
Hsieh, Chih-Cheng
Chang, Meng-Fan
Liu, Yi-Wen
Chen, Tsan-Jieh
Yang, Chia-Hsiang
Chiueh, Herming
Shyu, Juyo-Min
Tang, Kea-Tiong
電機資訊學士班
電子工程學系及電子研究所
Undergraduate Honors Program of Electrical Engineering and Computer Science
Department of Electronics Engineering and Institute of Electronics
關鍵字: Continuous restricted Boltzmann machine (CRBM);gas classification;nose-on-a-chip;ventilator-associated pneumonia (VAP)
公開日期: 1-十二月-2014
摘要: Ventilator-associated pneumonia (VAP) still lacks a rapid diagnostic strategy. This study proposes installing a nose-on-a-chip at the proximal end of an expiratory circuit of a ventilator to monitor and to detect metabolite of pneumonia in the early stage. The nose-on-a-chip was designed and fabricated in a 90-nm 1P9M CMOS technology in order to downsize the gas detection system. The chip has eight on-chip sensors, an adaptive interface, a successive approximation analog-to-digital converter (SAR ADC), a learning kernel of continuous restricted Boltzmann machine (CRBM), and a RISC-core with low-voltage SRAM. The functionality of VAP identification was verified using clinical data. In total, 76 samples infected with pneumonia (19 Klebsiella, 25 Pseudomonas aeruginosa, 16 Staphylococcus aureus, and 16 Candida) and 41 uninfected samples were collected as the experimental group and the control group, respectively. The results revealed a very high VAP identification rate at 94.06% for identifying healthy and infected patients. A 100% accuracy to identify the microorganisms of Klebsiella, Pseudomonas aeruginosa, Staphylococcus aureus, and Candida from VAP infected patients was achieved. This chip only consumes 1.27 mW at a 0.5 V supply voltage. This work provides a promising solution for the long-term unresolved rapid VAP diagnostic problem.
URI: http://dx.doi.org/10.1109/TBCAS.2014.2377754
http://hdl.handle.net/11536/124265
ISSN: 1932-4545
DOI: 10.1109/TBCAS.2014.2377754
期刊: IEEE TRANSACTIONS ON BIOMEDICAL CIRCUITS AND SYSTEMS
起始頁: 765
結束頁: 778
顯示於類別:期刊論文


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