Title: Design on mixed-voltage I/O buffers with consideration of hot-carrier reliability
Authors: Ker, Ming-Dou
Hu, Fang-Ling
College of Electrical and Computer Engineering
Issue Date: 2007
Abstract: A new circuit design for mixed-voltage I/O buffers to prevent hot-carrier degradation is proposed. The mixed-voltage (2xVDD tolerant) I/O buffer is designed with hot-carrier-prevented circuits in a 0.18-mu m CMOS process to receive 3.3-V (2xVDD tolerant) input signals without suffering gate-oxide reliability, circuit leakage issues, and hot-carrier degradation. In the experimental chip, the proposed mixed-voltage I/O buffer can be operated with signal speed of up to 266 MHz, which can fully meet the applications of PCI-X 2.0.
URI: http://hdl.handle.net/11536/12279
ISBN: 978-1-4244-0582-4
Journal: 2007 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), Proceedings of Technical Papers
Begin Page: 36
End Page: 39
Appears in Collections:Conferences Paper