標題: Crosstalk-insensitive via-programming ROMs using content-aware design framework
作者: Chang, MF
Chiou, LY
Wen, KA
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: code patterns;crosstalk;read only memory (ROM)
公開日期: 1-Jun-2006
摘要: Various code patterns of a via-programming read only memory (ROM) cause significant fluctuations in coupling noise between, bitlines (BLs). This crosstalk between BLs leads to read failure in high-speed via-programmable ROMs and limits the coverage of applicable code patterns. This work presents a content-aware design framework (CADF) for via-programming ROMs to overcome the crosstalk induced read failure. The CADF ROMs employ a content-aware structure and correspondent code-structure programming algorithm to reduce the amount of coupling noise source while maintaining nonminimal BL load for crosstalk reduction. A 256-Kb conventional ROM and a 256-Kb CADF ROM were fabricated using a 0.25-mu m logic CMOS process. The measured results ascertain that the read induced read failure is suppressed significantly by CADF. The CADF ROM also reduced 86.2% and 94.5% in power consumption and standby current compared to the conventional ROM, respectively.
URI: http://dx.doi.org/10.1109/TCSII.2006.873640
http://hdl.handle.net/11536/12223
ISSN: 1057-7130
DOI: 10.1109/TCSII.2006.873640
期刊: IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS
Volume: 53
Issue: 6
起始頁: 443
結束頁: 447
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