Title: Product-mix decision in a mixed-yield wafer fabrication scenario
Authors: Wu, Muh-Cherng
Chang, Wen-Jung
Chiou, Chie-Wun
工業工程與管理學系
Department of Industrial Engineering and Management
Keywords: mixed-yield scenario;product mix planning;scrapping
Issue Date: 1-Jul-2006
Abstract: The product mix decision problem for semiconductor manufacturing has been extensively studied in literature. However, most of them are based on a high-yield scenario. Yet, in a low-yield manufacturing environment, some research claims that scrap low-yield lots in an early stage may produce more profit. Considering the early scrapping characteristics, this paper aims to solve the product mix decision problem for a mixed-yield scenario, which involves the simultaneous production of high-yield and low-yield products. A nonlinear mathematical program is developed to model the decision problem. Two methods for solving the nonlinear program are proposed. Method 1 converts the nonlinear program into a linear program by setting some variables as parameters. The method provides an optimal solution by exhaustively searching these parameterized variables and solving the LP models iteratively. Method 2 aims to reduce the computation complexity while providing a near optimal solution. Experiment results show that method 2 is better than method 1, when aggregately considering solution quality and computation efforts.
URI: http://dx.doi.org/10.1007/s00170-005-2568-2
http://hdl.handle.net/11536/12112
ISSN: 0268-3768
DOI: 10.1007/s00170-005-2568-2
Journal: INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
Volume: 29
Issue: 7-8
Begin Page: 746
End Page: 752
Appears in Collections:Articles


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