標題: Spatially resolving the degradation of SPC thin-film transistors under AC stress
作者: Chang, Kai-Hsiang
Lee, Ming-Hsien
Lin, Horng-Chih
Huang, Tiao-Yuan
Lee, Yao-Jen
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 2007
URI: http://hdl.handle.net/11536/12056
ISBN: 978-1-4244-1891-6
期刊: 2007 INTERNATIONAL SEMICONDUCTOR DEVICE RESEARCH SYMPOSIUM, VOLS 1 AND 2
起始頁: 246
結束頁: 247
Appears in Collections:Conferences Paper