標題: Quantitative analysis of magnetization reversal in patterned strip wire by magnetic force microscopy
作者: Chen, D. C.
Chiang, D. P.
Yao, Y. D.
材料科學與工程學系
Department of Materials Science and Engineering
關鍵字: magnetic force microscopy;magnetization reversal;permalloy film
公開日期: 1-Sep-2006
摘要: Magnetic force microscopy (MFM) was used to investigate the magnetization reversal process in a patterned strip wire of permalloy thin film. The magnitude of the phase-shift of tapping mode MFM changed with the varying interactive magnetic force between the magnetic tip and the sample. By analyzing the change in values of the phase-shift. the behaviors of magnetization reversal of different local regions in a patterned strip wire can be quantitatively analyzed. The intensity of the phase-shift in the wider end is stronger than that in the narrower one. In contrast, due to a strong anisotropic effect. the coercive force in the narrower end (9 Oe) is larger than that ill the wider one (8 Oe). Therefore, the H-c in the neck section could become strongly affected by the competition of the head-to-tail magnetic configurations in the two parts of the strip wire, and this results in a small H-c in the neck section. In addition, in a simple neck shape connection in a strip NiFe wire, a single domain configuration can be easily changed to a two single domain magnetic configuration. (C) 2006 Elsevier B.V. All rights reserved.
URI: http://dx.doi.org/10.1016/j.jmmm.2006.02.014
http://hdl.handle.net/11536/11836
ISSN: 0304-8853
DOI: 10.1016/j.jmmm.2006.02.014
期刊: JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
Volume: 304
Issue: 1
起始頁: 23
結束頁: 26
Appears in Collections:Conferences Paper


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