|標題:||Precision measures for processes with multiple manufacturing lines|
|作者:||Pearn, W. L.|
Chang, C. S.
Department of Industrial Engineering and Management
|摘要:||Process capability indices C-p, and C-pk have been popularly used in the manufacturing industry for providing measures of process potential and performance. The precision index C-p is used to measure product quality consistency, while the yield index C-pk is used to provide measures of percentage of product conforming to manufacturing specifications. Properties of C-p for processes with a single manufacturing line have been investigated extensively. However, research on properties of C-p for processes with multiple manufacturing lines have been neglected. In this paper, we consider the precision index C-p for processes with three manufacturing lines. We develop a practical procedure for process precision testing to determine whether a process meets the precision requirement preset in the factory. An application example is given.|
|期刊:||INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY|
|Appears in Collections:||Articles|
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