標題: Bayesian approach for measuring EEPROM process capability based on the one-sided indices C-PU and C-PL
作者: Wu, Chien-Wei
Pearn, W. L.
工業工程與管理學系
Department of Industrial Engineering and Management
關鍵字: Bayesian approach;credible interval;process capability indices;posterior probability
公開日期: 1-十一月-2006
摘要: The purpose of process capability analysis is to provide numerical measures on whether a process is capable of reproducing items meeting the manufacturing specifications. Capability analyses have received considerable recent research attention and increased usage in process assessments and purchasing decisions. Most existing research works on capability analysis focus on estimating and testing process capability based on the traditional distribution frequency approach. In this paper, we propose a Bayesian approach based on the indices C-PU and C-PL to measure EEPROM process capability, in which the specifications are one-sided rather than two-sided. We obtain the credible intervals of C-PU and C-PL and develop a Bayesian procedure for capability testing. The posterior probability p, for which the process under investigation is capable, is derived. The credible interval is a Bayesian analog of the classical lower confidence interval. A process satisfies the manufacturing capability requirements if all the points in the credible interval are greater than the pre-specified capability level w. To make this Bayesian procedure practical for in-plant applications, a real example of an EEPROM manufacturing process is investigated, demonstrating how the Bayesian procedure can be applied to actual data collected in the factories.
URI: http://dx.doi.org/10.1007/s00170-005-0144-4
http://hdl.handle.net/11536/11639
ISSN: 0268-3768
DOI: 10.1007/s00170-005-0144-4
期刊: INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
Volume: 31
Issue: 1-2
起始頁: 135
結束頁: 144
顯示於類別:期刊論文


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