標題: Production of neutral fragments of gaseous SiCl4 following Si 2p core-level excitation studied by dispersed fluorescence spectroscopy
作者: Lu, K. T.
Chen, J. M.
Lee, J. M.
Ho, S. C.
Chang, H. W.
電子物理學系
Department of Electrophysics
公開日期: 1-Nov-2006
摘要: State-specific dissociation dynamics for ionic fragments and excited fragments of gaseous SiCl4 following Si 2p core-level excitation have been characterized by the dispersed UV/optical fluorescence spectroscopy and photionization mass spectroscopy. The Si 2p core-to-Rydberg excitation leads to a noteworthy production of excited atomic fragments, neutral and ionic (Si-*, Si+*). In particular, the excited neutral atomic fragments Si* are significantly reinforced. The Si 2p core-to-valence excitation generates an enhancement of excited molecular-ion SiCl4+. The experimental results provide deeper insight into the dissociation dynamics for excited neutral fragments of molecules via core-level excitation. (c) 2006 Elsevier Ltd. All rights reserved.
URI: http://dx.doi.org/10.1016/j.radphyschem.2006.09.001
http://hdl.handle.net/11536/11563
ISSN: 0969-806X
DOI: 10.1016/j.radphyschem.2006.09.001
期刊: RADIATION PHYSICS AND CHEMISTRY
Volume: 75
Issue: 11
起始頁: 2058
結束頁: 2062
Appears in Collections:Conferences Paper


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