|標題:||Production of neutral fragments of gaseous SiCl4 following Si 2p core-level excitation studied by dispersed fluorescence spectroscopy|
|作者:||Lu, K. T.|
Chen, J. M.
Lee, J. M.
Ho, S. C.
Chang, H. W.
Department of Electrophysics
|摘要:||State-specific dissociation dynamics for ionic fragments and excited fragments of gaseous SiCl4 following Si 2p core-level excitation have been characterized by the dispersed UV/optical fluorescence spectroscopy and photionization mass spectroscopy. The Si 2p core-to-Rydberg excitation leads to a noteworthy production of excited atomic fragments, neutral and ionic (Si-*, Si+*). In particular, the excited neutral atomic fragments Si* are significantly reinforced. The Si 2p core-to-valence excitation generates an enhancement of excited molecular-ion SiCl4+. The experimental results provide deeper insight into the dissociation dynamics for excited neutral fragments of molecules via core-level excitation. (c) 2006 Elsevier Ltd. All rights reserved.|
|期刊:||RADIATION PHYSICS AND CHEMISTRY|
|Appears in Collections:||Conferences Paper|
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