標題: A method for measuring two-dimensional refractive index distribution with the total internal reflection of p-polarized light and the phase-shifting interferometry
作者: Jian, Zhi-Cheng
Hsieh, Po-Jen
Hsieh, Hung-Chih
Chen, Huei-Wen
Su, Der-Chin
光電工程學系
Department of Photonics
關鍵字: total internal reflection;phase-shifting interferometry;Fresnel equations;two-dimensional refractive index distribution
公開日期: 1-Dec-2006
摘要: Based on the total internal reflection of p-polarized light and the phase-shifting interferometry, an alternative method for measuring the two-dimensional refractive index distribution of a material is presented. The p-polarized light is incident on the boundary between a right-angle prism and a tested material. When the total internal reflection occurs at the boundary, and the p-polarized light has a phase variation. It depends on the refractive index of the tested material. Firstly, the two-dimensional phase variation distribution of the p-polarized light at the boundary is measured by the four-step phase shifting interferometric technique. Then, substituting the data into the special equations derived from Fresnel equations, the two-dimensional refractive index distribution of the tested material can be obtained. (c) 2006 Elsevier B.V. All rights reserved.
URI: http://dx.doi.org/10.1016/j.optcom.2006.07.009
http://hdl.handle.net/11536/11482
ISSN: 0030-4018
DOI: 10.1016/j.optcom.2006.07.009
期刊: OPTICS COMMUNICATIONS
Volume: 268
Issue: 1
起始頁: 23
結束頁: 26
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