標題: Discrete Dopant Induced Characteristic Fluctuations in 16nm Multiple-Gate SOI Devices
作者: Li, Yiming
Hwang, Chih-Hong
Huang, Hsuan-Ming
Yeh, Ta-Ching
電信工程研究所
Institute of Communications Engineering
公開日期: 2007
URI: http://hdl.handle.net/11536/11445
http://dx.doi.org/10.1109/IVS.2007.4290101
ISBN: 978-1-4244-0879-5
ISSN: 1078-621X
DOI: 10.1109/IVS.2007.4290101
期刊: 2007 IEEE INTERNATIONAL SOI CONFERENCE PROCEEDINGS
起始頁: 117
結束頁: 118
Appears in Collections:Conferences Paper


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