標題: Accuracy analysis of the percentile method for estimating non normal manufacturing quality
作者: Wu, Chien-Wei
Pearn, W. L.
Chang, C. S.
Chen, H. C.
工業工程與管理學系
Department of Industrial Engineering and Management
關鍵字: flexible capability indices;non normal distributions;relative bias;sample percentile estimator;simulation
公開日期: 2007
摘要: Vannman ( 1995) proposed a superstructure C-p(u, v) of capability indices for processes with normal distributions, which include C-p, C-pk, C-pm, and C-pmk as special cases. Pearn and Chen (1997) considered a generalization of C-p(u, v), called C-Np(u, v), to cover processes with non normal distributions. Pearn and Chen ( 1997) also proposed a sample percentile estimator for the generalization C-Np(u , v). In this article, we investigate the performance of the sample percentile estimator. We perform some simulation study, which covers the normal distribution and various non normal distributions including the uniform distribution, chi-square distribution, student's t distributions, F distribution, beta distribution, gamma distribution, Weibull distribution, lognormal distribution, triangular distribution, and Laplace distribution, with selected parameter values. Extensive simulation results, comparisons, and analysis are provided.
URI: http://hdl.handle.net/11536/11391
http://dx.doi.org/10.1080/03610910701212785
ISSN: 0361-0918
DOI: 10.1080/03610910701212785
期刊: COMMUNICATIONS IN STATISTICS-SIMULATION AND COMPUTATION
Volume: 36
Issue: 3
起始頁: 657
結束頁: 697
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