標題: Electron differential inverse mean free path for surface electron spectroscopy
作者: Chen, YF
Kwei, CM
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: electron-solid interactions, scattering;photoelectron spectroscopy
公開日期: 20-八月-1996
摘要: A new, general expression for the position-dependent differential inverse mean free path (DIMFP) of an electron penetrating into vacuum from a solid is derived. This DIMFP can be divided up into a bulk and a surface term. It is found that the surface effect is restricted to a surface layer extending on both sides of the vacuum-solid interface. An extended Drude dielectric function, which allows the characteristic oscillator strength, damping constant, and critical-point energy for each subband of valence electrons, is employed to estimate electron DIMFPs near Al and Au surfaces. Our results are relevant to the understanding of inelastic electron scattering near a solid surface.
URI: http://dx.doi.org/10.1016/0039-6028(96)00616-4
http://hdl.handle.net/11536/1102
ISSN: 0039-6028
DOI: 10.1016/0039-6028(96)00616-4
期刊: SURFACE SCIENCE
Volume: 364
Issue: 2
起始頁: 131
結束頁: 140
顯示於類別:期刊論文


文件中的檔案:

  1. A1996VC77700013.pdf