標題: Quantitative phase retrieval in transmission hard x-ray microscope
作者: Yin, Gung-Chian
Chen, Fu-Rong
Hwu, Yeukuang
Shieh, Han-Ping D.
Liang, Keng S.
光電工程學系
顯示科技研究所
Department of Photonics
Institute of Display
公開日期: 30-Apr-2007
摘要: Quantitative phase retrieval with a sub-100-nm resolution is achieved from micrographs of a zone plate based transmission x-ray microscope. A plastic zone plate containing objects of sizes from micrometers down to tens of nanometers is used as a test sample to quantify the retrieved phase. Utilizing the focal serial images in the image plane, the phase information is retrieved quantitatively across the entire range of sizes by combining the transport intensity equation and self-consistent wave propagation methods in this partial coherence system. The study demonstrates a solution to overcome the deficiency encountered in the two phase retrieval approaches. (c) 2007 American Institute of Physics.
URI: http://dx.doi.org/10.1063/1.2724066
http://hdl.handle.net/11536/10882
ISSN: 0003-6951
DOI: 10.1063/1.2724066
期刊: APPLIED PHYSICS LETTERS
Volume: 90
Issue: 18
結束頁: 
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