Title: IEEE standard 1500 compatible oscillation ring test methodology for interconnect delay and crosstalk detection
Authors: Li, Katherine Shu-Min
Lee, Chung-Len
Su, Chauchin
Chen, Jwu E.
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
Keywords: oscillation ring (OR) test scheme;interconnect test;SOC testing;stuck-at faults;open faults;delay faults;crosstalk glitches;IEEE P1500;wrapper cell design
Issue Date: 1-Aug-2007
Abstract: A novel oscillation ring (OR) test scheme and architecture for testing interconnects in SOC is proposed and demonstrated. In addition to stuck-at and open faults, this scheme can also detect delay faults and crosstalk glitches, which are otherwise very difficult to be tested under the traditional test schemes. IEEE Std. 1500 wrapper cells are modified to accommodate the test scheme. An efficient algorithm is proposed to construct ORs for SOC based on a graph model. Experimental results on MCNC benchmark circuits have been included to show the effectiveness of the algorithm. In all experiments, the scheme achieves 100% fault coverage with a small number of tests.
URI: http://dx.doi.org/10.1007/s10836-007-0759-5
http://hdl.handle.net/11536/10495
ISSN: 0923-8174
DOI: 10.1007/s10836-007-0759-5
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
Volume: 23
Issue: 4
Begin Page: 341
End Page: 355
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