標題: A statistical model for simulating the effect of UPS TFT device variation for SOP applications
作者: Tai, Ya-Hsiang
Huang, Shih-Che
Chen, Wan-Ping
Chao, Yu-Te
Chou, Yen-Pang
Peng, Guo-Feng
光電工程學系
顯示科技研究所
Department of Photonics
Institute of Display
關鍵字: poly-Si thin-film transistor (TFT);statistical model;variation
公開日期: 1-十二月-2007
摘要: In this paper, the variation characteristics of low-temperature polycrystalline silicon (LTPS) thin-film transistors (TFTs) are investigated with a statistical approach. A special layout is proposed to investigate the device variation with respect to various devices distances. Two non-Gaussian equations are proposed to fit the device parameter distributions, whose the coefficients of determination (R(2)) are both near 0.9, reflecting the validity of the model. Two benchmark circuits are used to compare the difference between the proposed model and the conventional Gaussian distribution for the device parameter distribution. The output behaviors of the digital and analog circuits show that the variation in the short range would greatly affect the performance of the analog circuits and would instead be averaged in the digital circuits.
URI: http://dx.doi.org/10.1109/JDT.2007.903155
http://hdl.handle.net/11536/10059
ISSN: 1551-319X
DOI: 10.1109/JDT.2007.903155
期刊: JOURNAL OF DISPLAY TECHNOLOGY
Volume: 3
Issue: 4
起始頁: 426
結束頁: 433
顯示於類別:期刊論文


文件中的檔案:

  1. 000259064600013.pdf