Search


Results 1-10 of 163 (Search time: 0.129 seconds).

Item hits:
Issue DateTitleAuthor(s)
30-Nov-2015Improvements in the reliability of a-InGaZnO thin-film transistors with triple stacked gate insulator in flexible electronics applicationsChen, Hua-Mao; Chang, Ting-Chang; Tai, Ya-Hsiang; Chen, Kuan-Fu; Chiang, Hsiao-Cheng; Liu, Kuan-Hsien; Lee, Chao-Kuei; Lin, Wei-Ting; Cheng, Chun-Cheng; Tu, Chun-Hao; Liu, Chu-Yu; 電子物理學系; 光電工程學系; Department of Electrophysics; Department of Photonics
2016高維影像特徵於物件追蹤之研究康景翔; 田仲豪; 戴亞翔; Kang, Ching-Hsiang; Tien, Chung-Hao; Tai, Ya-Hsiang; 光電工程研究所
1-Jan-2015Hysteresis of Transistor Characteristics of Amorphous IGZO TFTs Studied by Controlling Measurement SpeedChen, Yi-Jung; Tai, Ya-Hsiang; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
2007Highly reliable integrated amorphous silicon thin film transistors gate driverLiu, Chin-Wei; Tai, Ya-Hsiang; 光電工程學系; Department of Photonics
2007Dynamic stress effects on the reliability of poly-Si TFTKuo, Yan-Fu; Huang, Shih-Che; Shih, Wei-Lun; Tai, Ya-Hsiang; 光電工程學系; Department of Photonics
2008Elimination of photoleakage current in poly-Si TFTs using a metal-shielding structureLu, Hau-Yan; Chang, Ting-Chang; Liu, Po-Tsun; Li, Hung-Wei; Hu, Chin-Wei; Lin, Kun-Chih; Tai, Ya-Hsiang; Chi, Sien; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-Dec-2006Analysis of poly-Si TFT degradation under gate pulse stress using the slicing modelTai, Ya-Hsiang; Huang, Shih-Che; Chen, Chien-Kwen; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
2007Degradation of the capacitance-voltage behaviors of the low-temperature polysilicon TFTs under DC stressTai, Ya-Hsiang; Huang, Shih-Che; Lin, Chien Wen; Chiu, Hao Lin; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
2016應用於可撓式透明顯示器之薄膜電晶體技術陳華茂; 戴亞翔; 張鼎張; Chen, Hua-Mao; Tai, Ya-Hsiang; Chang, Ting-Chang; 光電工程研究所
2012提升三維多點互動系統使用者辨識能力之多圖騰演算法開發黃書怡; Huang, Shu-Yi; 戴亞翔; Tai, Ya-Hsiang; 光電工程學系