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公開日期標題作者
1-一月-1997A-axis YBCO thin films deposited by DC magnetron sputteringTsai, WC; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-1996AC permeability of the flux-line liquid in the anisotropic high-T-c superconducting crystalsWu, CJ; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-1996AC response of the vortex liquid in the high-T-c superconducting cylinderWu, CJ; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-六月-1999Analysis of AC electrical response for radio-frequency sputtered (Ba0.5Sr0.5)TiO3 thin filmWang, YP; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十一月-2001Application of on-wafer TRL calibration on the measurement of microwave properties of Ba0.5Sr0.5TiO3 thin filmsLue, HT; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-1999Ba(Ti0.8Sn0.2)O-3 thin films prepared by radio-frequency magnetron sputtering for dynamic random access memory applicationsKuo, YF; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1999(Ba,Sr)TiO3 thin films: Preparation, properties and reliabilityTseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-六月-2005Bistable resistive switching of a sputter-deposited Cr-doped SrZrO3 memory filmLiu, CY; Wu, PH; Wang, A; Jang, WY; Young, JC; Chiu, KY; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005Characteristics and electrochemical performance of supercapacitors with manganese oxide-carbon nanotube nanocomposite electrodesLee, CY; Tsai, HM; Chuang, HJ; Li, SY; Lin, P; Tseng, TY; 材料科學與工程學系; 電子工程學系及電子研究所; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics
1-七月-2002Characterization of porous silicate for ultra-low k dielectric applicationLiu, PT; Chang, TC; Hsu, KC; Tseng, TY; Chen, LM; Wang, CJ; Sze, SM; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
28-八月-1997Characterization of yttria-stabilized zirconia thin films grown by planar magnetron sputteringTsai, WC; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2004CMP of low-k methylsilsesquiazane with oxygen plasma treatment for multilevel interconnect applicationsChang, TC; Tsai, TM; Liu, PT; Chen, CW; Yan, ST; Aoki, H; Chang, YC; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-八月-1998Conduction mechanism and temperature-dependent current-voltage in (Ba, Sr)TiO3 thin filmsTsai, MS; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-1998Conduction mechanisms in amorphous and crystalline Ta2O5 thin filmsEzhilvalavan, S; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2003Copper-catalyzed ZnO nanowires on silicon (100) grown by vapor-liquid-solid processLi, SY; Lee, CY; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2004Correlation between deep depletion and current-voltage saturation of SrTiO3 gate dielectric capacitorLiu, CY; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-二月-1998Correlation of grain boundary characteristics with electrical properties in ZnO-glass varistorsLee, YS; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
22-十二月-2004Cu-penetration induced breakdown mechanism for a-SiCNChen, CW; Liu, PT; Chang, TC; Yang, JH; Tsai, TM; Wu, HH; Tseng, TY; 電子工程學系及電子研究所; 光電工程學系; 顯示科技研究所; Department of Electronics Engineering and Institute of Electronics; Department of Photonics; Institute of Display
15-五月-2004Deep depletion phenomenon of SrTiO3 gate dielectric capacitorLiu, CY; Chen, BY; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-六月-2002Deep electron trapping centers in Te-doped (AlxGa1-x)(0.5)In0.5P (x=0.5) layers grown by metal-organic chemical vapor depositionSung, WJ; Huang, KF; Tseng, TY; 電子物理學系; Department of Electrophysics