Browsing by Author Su, CC

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Showing results 1 to 16 of 16
Issue DateTitleAuthor(s)
2005All digital 625Mbps & 2.5Gbps deskew buffer designLu, HW; Chang, YT; Su, CC; 電控工程研究所; Institute of Electrical and Control Engineering
1-Feb-2002Analysis of application of the IDDQ technique to the deep sub-micron VLSI testingLu, CW; Lee, CL; Su, CC; Chen, JE; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Sep-2000A behavior-level fault model for the closed-loop operational amplifierChang, YJ; Lee, CL; Chen, JE; Su, CC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2004A digital LVDS driver with simultaneous switching noise rejectionWang, HW; Lu, HW; Su, CC; 電控工程研究所; Institute of Electrical and Control Engineering
2004Dynamic analog testing via ATE digital test channelsSu, CC; Chang, CS; Huang, HW; Tu, DS; Lee, CL; Lin, JCH; 電機學院; College of Electrical and Computer Engineering
2000Fault diagnosis for linear analog circuitsLin, JW; Lee, CL; Su, CC; Chen, JE; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2001Fault diagnosis for linear analog circuitsLin, JW; Lee, CL; Su, CC; Chen, JE; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005Finite state machine synthesis for at-speed oscillation testabilityLi, KSM; Lee, CL; Jiang, T; Su, CC; Chen, JE; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Sep-2005Low-power fully integrated and tunable CMOS RF wireless receiver for ISM band consumer applicationsLi, SC; Kao, HS; Chen, CP; Su, CC; 交大名義發表; National Chiao Tung University
2000A methodology for fault model development for hierarchical linear systemsHuang, YC; Lee, CL; Lin, JW; Chen, JE; Su, CC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1998A new IDDQ testing scheme employing charge storage BICS circuit for deep submicron CMOS ULSILu, CW; Lee, CL; Chen, JE; Su, CC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2003A novel LCD driver testing technique using logic test channelsSu, CC; Wang, WJ; Wang, CH; Tseng, IS; 電控工程研究所; Institute of Electrical and Control Engineering
1-Mar-2006Optical recombination-emission characteristics and surface morphologies of InAs quantum dots grown on misoriented GaAs substrate by MOCVDHsu, MY; Tang, SF; Chiang, CD; Su, CC; Wang, LC; Kuo, CT; 交大名義發表; National Chiao Tung University
2005A spread spectrum clock generator for SATA-IIChen, WT; Hsu, JC; Lune, HW; Su, CC; 電控工程研究所; Institute of Electrical and Control Engineering
2004A unified approach to detecting crosstalk faults of interconnects in deep submicron VLSILi, KSM; Lee, CL; Su, CC; Chen, JE; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2004Windowed multicarrier systems with minimum spectral leakageLin, YP; Jian, YY; Su, CC; Phoong, SM; 電控工程研究所; Institute of Electrical and Control Engineering