Browsing by Author Liu, C. H.

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
or enter first few letters:  
Showing results 1 to 9 of 9
Issue DateTitleAuthor(s)
2015Design of Complementary Tilt-gate TFETs with SiGe/Si and III-V Integrations Feasible for Ultra-low-power ApplicationsHsieh, E. R.; Lin, Y. S.; Zhao, Y. B.; Liu, C. H.; Chien, C. H.; Chung, Steve S.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2014The Experimental Demonstration of the BTI-Induced Breakdown Path in 28nm High-k Metal Gate Technology CMOS DevicesHsieh, E. R.; Lu, P. Y.; Chung, Steve S.; Chang, K. Y.; Liu, C. H.; Ke, J. C.; Yang, C. W.; Tsai, C. T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jan-2017Geometric Variation: A Novel Approach to Examine the Surface Roughness and the Line Roughness Effects in Trigate FinFETsHsieh, E. R.; Fan, Y. C.; Liu, C. H.; Chung, Steve S.; Huang, R. M.; Tsai, C. T.; Yew, T. R.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2011High Efficiency E-coli Concentration via Dynamic Light-induced Optoelectro-osmosis Flow on Organic Photoconductivity BiochipYang, S. M.; Lin, C. Y.; Wang, T. P.; Punde, T. H.; Chang, H. Y.; Hsu, L.; Liu, C. H.; 電子物理學系; Department of Electrophysics
2008National Project on 45 to 32 nm Metal Oxide Semiconductor Field Effect Transistors for Next Century IC FabricationsHwang, Huey-liang; Wang, C. W.; Chang, K. H.; Tsai, C. H.; Leou, K. C.; Chang-Liao, Kuei-Shu; Lu, Chun-Chang; Chang, S. C.; Chiu, F. C.; Liu, C. H.; Chin, Albert; Chang, Kow-Ming; Chen, Bwo-Ning; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jan-2017A Novel Design of P-N Staggered Face-tunneling TFET Targeting for Low Power and Appropriate Performance ApplicationsHsieh, E. R.; Fan, Y. C.; Chang, K. Y.; Liu, C. H.; Chien, C. H.; Chung, Steve S.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jan-2018A Novel ReWritable One-Time-Programming OTP (RW-OTP) Realized by Dielectric-fuse RRAM Devices Featuring Ultra-High Reliable Retention and Good Endurance for Embedded ApplicationsCheng, H. W.; Hsieh, E. R.; Huang, Z. H.; Chuang, C. H.; Chen, C. H.; Li, F. L.; Lo, Y. M.; Liu, C. H.; Chung, Steve S.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2012NUSAS: NEGATIVE PRESSURE DRIVING HEPG2/3T3 CELLS MIXING/GRADIENT CO-CULTURE INSIDE U TRAPPER ARRAY ON RAPID MULTICELLULAR SPHEROID ASSEMBLING SYSTEMYang, S. M.; Fu, C. Y.; Tseng, S. Y.; Srinivasu, V. P.; Shilpa, S.; Chang, H. Y.; Hsu, L.; Liu, C. H.; 電子物理學系; Department of Electrophysics
1-Jan-2014The Observation of BTI-induced RTN Traps in Inversion and Accumulation Modes on HfO2 High-k Metal Gate 28nm CMOS DevicesWu, P. C.; Hsieh, E. R.; Lu, P. Y.; Chung, Steve S.; Chang, K. Y.; Liu, C. H.; Ke, J. C.; Yang, C. W.; Tsai, C. T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics